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Sarid, Dror
Exploring scanning probe microscopy with mathematica / Dror Sarid
2nd completely rev. and enl. ed
Weinheim : Wiley-VCH, c2007
book jacket
Location Call Number Status
 4th Floor  QH212.S33 S27 2007  v.1    AVAILABLE
 Circ.Desk/Software  QH212.S33 S27 2007  v.2    AVAILABLE
Subject Mathematica (Computer file)
Subject(s) Scanning probe microscopy -- Data processing
Physical Description 310 p. : ill. ; 25 cm. + 1 CD-ROM (4 3/4 in.)
Note INCLUDES CD-ROM, FILED IN DISK STORAGE AT CIRCULATION DESK
Previous ed.: Chichester : John Wiley, 1997
Includes bibliographical references and index
Contents Introduction -- Uniform cantilevers -- Cantilever conversion tables -- V-shaped cantilevers -- Tip-sample adhesion -- Tip-sample force curve -- Free vibrations -- Noncontact mode -- Metal-insulator-metal tunneling -- Fowler-Norheim tunneling -- Coulomb blockade -- Density of states -- Electrostatics -- Near-field optics -- Construction and boundary resistance -- Scanning thermal conductivity microscopy -- Kelvin probe force microscopy -- Raman scattering in nanocrystals
[v. 1.] Text -- [v. 2.] CD-ROM

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